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METROLOGY EQUIPMENT
Conquer Industries strives to provide quality pre-owned
equipment at reasonable prices. Below is a sampling from
our current inventory. Of course, many other types of
equipment are available, please call us to discuss these
systems, or any other equipment needs you may have.
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ESTEK WIS 600(NEW ITEM) |
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Estek WIS 600, Designed to completely analyze substrates, films and oxides used in the manufacture of semiconductors. Dark and light channel system. Dark channel is used for detecting particles and any light scattering defects. Light channel is useful for detecting non-light scattering defects such as mounds, dimples and non uniformity. Detects specular flaws, including large particles, mounds, dimples, saw marks, grooves, fractures, slip, epi-spikes, small particles on large grained surfaces, particles buried in/under a film. Detection 0.30 µm or .20 µm(optional) on Silicon at 95% capture rate. Verified by NIST Traceable Standards.
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BioRad 5900+ Stripping Hall Profiler (NEW ITEM) |
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An automatic system for measuring carrier concentration
and mobility profiles of Silicon and compound semiconductors
- 12 X 12 mm max sample size
- 20uA to 5mA anodize current
- 0-25.5V/0-127.5V anodize volts
- 100W quartz lamp
- >5nm depth resolution
- .32 Tesla Mag strength
- 1 Mohm/sq max sheet res.
- AC(200Hz)/ DC meas. Mode
- Instruction Manual
- Computer based system
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Plasmos SD 2002 Ellipsometer |
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Can handle up to 8" wafers. System is being offered in AS IS
condition. Contact us for more information.
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UltraPoint 1000 |
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Call for details and additional information.
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Prometrix RS 30 with Loader |
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Prometrix Omnimap RS 30 Resistivity mapping system
- Up to 8 in wafers
- Uses for point probes to measure Resistivity on films
- Offers Contour and 3-D mapping as well as trend charts
- Includes wafer cassette loader system
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Prometrix SM200e |
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Fully rebuilt with a warranty. Contact us for details.
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